Statistical Calibration of Wafer Probe Data into a Fixtured Environment

A methodology for improving the design verification process will be discussed. Statistical regression was used to determine the relationship between wafer probe and fixtured S-parameter and compression measurements. Statistical calibration is discussed in the context of modeling measurements of both the magnitude and phase in a fixtured environment given wafer probe data. The calibration procedure was successfully demonstrated on power amplifier data over the 6.5- to 20-GHz range.