Proximity effect in edge type junctions with PrBa/sub 2/Cu/sub 3/O/sub 7/ barriers prepared by Br-ethanol etching

Multilayer Josephson edge type junctions were prepared on the edges of c-axis oriented YBa/sub 2/Cu/sub 3/O/sub 7/ thin films structured by chemical etching in a Br-ethanol solution. Resistive PrBa/sub 2/Cu/sub 3-x/Ga/sub x/O/sub 7/ (x=0, 0.15, and 0.3) films were deposited by the high oxygen pressure dc-sputtering technique and used for barrier and insulation layers. Basic properties of the junctions such as I/sub c/(T), I/sub c/(d), R/sub n/(T), and basic characteristics of the proximity effect such as /spl xi//sub n/, /spl gamma/ and /spl gamma//sub B/ were obtained and discussed.<
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