The use of a test specification format in automatic test program generation

Test specifications formats (TSFs) to facilitate standardization of testing information on ICs and circuit boards are examined. The author describes the application areas of a TSF and shows the practical use of one particular TSF, the neutral code format (NCF) proposed by C. Mortensen (1987). By writing a translator from NCF to a test programming language, it was seen that automatic test program generation is possible. It is found, however, that only GO/NOGO test programs could be generated.<
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