A contribution to testing of analog integrated circuits in the DC domain

A test method for analog circuits is presented which is based upon simple DC measurements that can be performed directly on the wafer. The method handles parameters at various levels, e.g. process, device and circuit parameters. In contrast to other methods that use parameter intervals, the method described obtains a mathematical relation between the parameters, which results in a more powerful decision criterion. The method may be used as the basis for automatic testing.<
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