Random test length for bounded faults in RAMs

The authors study a very general class of memory faults that includes the usual stuck-at, coupling, and pattern-sensitive faults. This is the class that consists of 'bounded faults' that is, faults that involve a bounded number of cells. Some bounded faults are known to require deterministic tests of length proportional to n log/sub 2/ n, where n is the total number of memory cells. The main result of this paper is that, for any bounded fault satisfying certain mild conditions, the random test length required for a given level of confidence is always O(n).<
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