Electret measurements with ionic charge technique

A number of novel techniques for the investigation of thin electret films are proposed. These techniques employ ionic charge deposition on the external surface of thin films by using an original scanning mercury probe. The value and the spatial distribution of the deposited charge were monitored with the help of the same mercury probe. These techniques make it possible to monitor the conductivity of the electret layers, to study processes of charge accumulation in the volume of thin films, and to measure the trap parameters. These techniques are a good tool for studying the migration of ions along the electret film surfaces and for monitoring the processes of equilibrium establishment between these surfaces and the surrounding medium.<
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