Plane-Wave Interaction with Structures of Thin Absorbing Films (Short Papers)

Electromagnetic plane-wave absorption by resistive films of finite dimensions are considered. It is proposed that the effect of edge diffraction from a finite film causes the experimentally observed frecuency-dependent sensitivity of thin-film microwave-power monitors. Methods are outlined to prevent such frecuency dispersion. It is pointed out that the position of a microwave power source can be determined by 3 pairs of perpendicularly placed thin-film monitors.