Annealing Conditions of SCO Buffer Layer via Slot-Die Technique

A biaxially textured Sm
_0.2
Ce
_0.8
O
_1.9-x
(SCO) single buffer layer has been prepared on textured Ni-5%W alloy substrate using slot-die coating for REBCO (
$\text{RE}=\text{Y}$
, La, and other lanthanides)-coated conductors. A smooth, uniform, and crack-free SCO buffer layer with sharp (200)
$c$
-axis orientation has been obtained by controlling the annealing conditions, including the decomposition rate of SCO precursor film, the flow rate of protective gas, the heat treatment temperature, and time.