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Extraction of Channel Electron Effective Mobility in InGaAs/Al _{\bf 2} O _{\bf 3} n-FinFETs

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7 Author(s)
Yaodong Hu ; State Key Lab ASIC and System, Department of Microelectronics, Fudan University, Shanghai, China ; Shengwei Li ; Guangfan Jiao ; Y. Q. Wu
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