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Defect reduction in photon-accelerated negative bias instability of InGaZnO thin-film transistors by high-pressure water vapor annealing

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4 Author(s)
Seung Rim, You ; School of Electrical and Electronic Engineering, 50 Yonsei-ro, Seodaemun-gu, Yonsei University, Seoul 120-749, South Korea ; Jeong, Wooho ; Du Ahn, Byung ; Jae Kim, Hyun