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Electrical Characteristics for Flash Memory With Germanium Nitride as the Charge-Trapping Layer

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5 Author(s)
Chia-Chun Lin ; Dept. of Eng. & Syst. Sci., Nat. Tsing-Hua Univ., Hsinchu, Taiwan ; Yung-Hsien Wu ; Yuan-Sheng Lin ; Min-Lin Wu
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