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Experimental Investigation of Hole Transport in Strained \hbox {Si}_{1 - x}\hbox {Ge}_{x}/\hbox {SOI} pMOSFETs—Part I: Scattering Mechanisms in Long-Channel Devices

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6 Author(s)
Mikaël Casse ; CEA/LETI, MINATEC Campus, Grenoble Cedex 9, France ; L. Hutin ; Cyrille Le Royer ; D. Cooper
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