Post-growth manipulation of the internal electric field in CdZnTe crystals using sub-bandgap illumination is measured as a function of temperature through infrared (IR) transmission measurements. Using near sub-bandgap IR illumination, both the optical de-trapping of charge carriers and the reduction in carrier recombination increased the mobility lifetime in the crystal. The increased carrier transport is a direct result of decreased hole and electron trapping in addition to other underlying mechanisms. Concentration of the electric field near the cathode is also observed. We measured the electric field distribution with sub-bandgap illumination as a function of temperature via the Pockels effect.