By Topic

1620-2008  -   Redline Version
IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials - Redline

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

This document is only available as part of a bundle
Options Non-Member Member
$112.0 $90.0
IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials - RedlineView Bundle Details

Bundle Details

IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials - Redline

This bundle includes the following items:
  • 1620-2008 selected IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials - Redline
  • 1620-2008 IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
Non Member: $112.0 Member: $90.0
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions