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Efficient blocking of planar defects by prismatic stacking faults in semipolar (1122)-GaN layers on m-sapphire by epitaxial lateral overgrowth

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5 Author(s)
Lacroix, B. ; CIMAP, UMR 6252, CNRS-ENSICAEN-CEA-UCBN, 6 Bd Maréchal Juin, 14050 Caen, France ; Chauvat, M.P. ; Ruterana, P. ; Nataf, G.
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