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A test pattern matching method on bast architecture using don't care identification for random pattern resistant faults

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5 Author(s)
Toshinori Hosokawa ; College of Industrial Technology, Nihon University 1-2-1, Izumicho, Narashino, Chiba 275-8575, Japan ; Yun Chen ; LingLing Wan ; Motohiro Wakazono
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