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Strain at Native {\rm SiO}_{2}/{\rm Si}(111) Interface Characterized by Strain-Scanning Second-Harmonic Generation

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7 Author(s)
Ji-Hong Zhao ; State Key Lab. for Integrated Optoelectron., Jilin Univ., Changchun, China ; Wen Su ; Chen, Qi-Dai ; Ying Jiang
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