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Glitch-induced within-die variations of dynamic energy in voltage-scaled nano-CMOS circuits

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5 Author(s)
Dina Kamel ; Microelectronics Laboratory, ICTEAM Institute, Université catholique de Louvain (UCL), Place du Levant, 3, 1348 Louvain-la-Neuve, Belgium ; Cédric Hocquet ; François-Xavier Standaert ; Denis Flandre
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