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Nanostructuring of epitaxial graphene layers on SiC by means of field-induced atomic force microscopy modification

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5 Author(s)
Rius, G. ; Instituto de Microelectrónica de Barcelona (IMB-CNM, CSIC), Campus UAB, 08193 Bellaterra, Spain ; Camara, N. ; Godignon, P. ; Perez-Murano, F.
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