Skip to Main Content
IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards,
eBooks, and eLearning courses.
Learn more about:
IEEE Xplore subscriptions
Your organization might have access to this article on the publisher's site. To check,
click on this link:http://dx.doi.org/+10.1063/1.1599061
We develop a highly sensitive scanning far-infrared (FIR) microscope, which consists of a silicon solid immersion lens that probes FIR and a condenser lens that focuses the FIR onto a small quantum Hall detector (400 μm×400 μm). The solid immersion lens is in contact with the backside of a Hall bar sample, which is moved with a mechanical XY stage. The quantum Hall detector, which function as a narrow band FIR detector (bandwidth of about 2%), is a Hall bar with a large length-to-width ratio in integer quantum Hall effect regimes. The microscope is successfully applied to image extremely weak cyclotron emissions from quantum Hall devices with a spatial resolution of about 50 μm and a signal-to-noise ratio improved by a factor 18 compared to a previous system. © 2003 American Institute of Physics.
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.