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Colloid probes with increased tip height for higher sensitivity in friction force microscopy and less cantilever damping in dynamic force microscopy

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3 Author(s)
Schmutz, Jan-Erik ; Center for Nanotechnology (CeNTech), Gievenbecker Weg 11, 48149 Münster, Germany and Physikalisches Institut, Westfälische Wilhelms Universität Münster, Wilhelm-Klemm-Str. 10, 48149 Münster, Germany ; Schafer, Marcus M. ; Holscher, Hendrik