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Micromachined ultrasharp silicon and diamond-coated silicon tip as a stable field-emission electron source and a scanning probe microscopy sensor with atomic sharpness

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10 Author(s)
Rangelow, I.W. ; Institute of Technical Physics, University of Kassel, 34 132-Kassel, Germany ; Shi, F. ; Hudek, P. ; Grabiec, P.
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