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Nitrogen incorporation into strained (In, Ga) (As, N) thin films grown on (100), (511), (411), (311), and (111) GaAs substrates studied by photoreflectance spectroscopy and high-resolution x-ray diffraction

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6 Author(s)
Ibanez, J. ; Institut Jaume Almera, Consell Superior d’Investigacions Científiques (CSIC), Lluís Solé i Sabarís s/n, 08028 Barcelona, Catalonia, Spain ; Kudrawiec, R. ; Misiewicz, J. ; Schmidbauer, M.
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