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Broad-area optical characterization of well-width homogeneity in GaN/AlxGa1-xN multiple quantum wells grown on sapphire wafers

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9 Author(s)
Pomarico, A. ; INFM-Dipartimento di Ingegneria dell’Innovazione, University of Lecce, Italy ; Lomascolo, M. ; Passaseo, A. ; Cingolani, R.
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