Skip to Main Content
IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards,
eBooks, and eLearning courses.
Learn more about:
IEEE Xplore subscriptions
Your organization might have access to this article on the publisher's site. To check,
click on this link:http://dx.doi.org/+10.1063/1.125904
An electrode contact scheme based on the use of an organic LiF alloy is investigated. The performance of organic light emitting diodes (OLED) with this contact scheme in both heterojunction and bipolar transport/emitting layer (BTEL) OLED structures are compared with their counterparts with LiF buffer layers. The organic LiF contact scheme improved device reliability of BTEL OLEDs by 32% to 92 500 h while adversely affecting device reliability of heterojunction OLEDs. © 2000 American Institute of Physics.
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.