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Investigation of oval defects in InGaAs/GaAs strained-layer heterostructures using cathodoluminescence and wavelength dispersive spectroscopy

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5 Author(s)
Russell-Harriott, J.J. ; Microstructural Analysis Unit, University of Technology, Sydney, NSW 2007, Australia ; Zou, J. ; Moon, A.R. ; Cockayne, D.J.H.
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