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A Si nanopillar grown on a Si tip by atomic force microscopy in ultrahigh vacuum for a high-quality scanning probe

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2 Author(s)
Arai, Toyoko ; School of Materials Science, Japan Advanced Institute of Science and Technology, Tatsunokuchi, Ishikawa 923-1292, Japan and PRESTO, Japan Science and Technology Agency, Saitama 332-0012, Japan ; Tomitori, Masahiko