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Composition measurement in strained AlGaN epitaxial layers using x-ray diffraction

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5 Author(s)
Wallis, D.J. ; QinetiQ, Malvern Technology Centre, St. Andrews Road, Malvern, WR14 3PS, United Kingdom ; Keir, A.M. ; Balmer, R.S. ; Soley, D.E.J.
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