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Annealing effects on optical and structural properties of 1.3-μm GaInNAs/GaAs quantum-well samples capped with dielectric layers

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7 Author(s)
Liu, H.F. ; Optoelectronics Research Center, Tampere University of Technology, Tampere 33101, Finland ; Peng, C.S. ; Pavelescu, E.-M. ; Jouhti, T.
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