Skip to Main Content
| Create Account
| Sign In
IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards,
eBooks, and eLearning courses.
Learn more about:
IEEE Xplore subscriptions
Your organization might have access to this article on the publisher's site. To check,
click on this link:http://dx.doi.org/+10.1063/1.1506950
We developed a method for extracting the height probability density of random surfaces by light scattering. Theoretical results show that height probability function is the Fourier transform of the central δ-peak in the light waves of angle-resolved light scattering. Experimentally, we measure the δ-peak intensities at a different angle of incidence in a simple setup. We then reconstruct the phase distributions of the δ-peak versus the perpendicular component of the wave vector from the intensities using the Gerchberg–Saxton inversion algorithm, and then extract the height probability density of the samples. Two different types of samples are measured to verify the validity of the method, and the results are compared with those obtained by atomic force microscopy. © 2002 American Institute of Physics.
Applied Physics Letters
Date of Publication:
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.