BiFeO3 -PbTiO3 (BFO-PT) films were synthesized by sol-gel method with the annealing temperatures to be 550degC, 600degC, and 650degC, respectively. The structure and morphology of the films were characterized by X-ray diffraction (XRD) and scanning electron microscope (SEM). The dielectric constant and loss factor are measured. The leakage current density is also performed to check the conductivity of the films. The effect of annealing temperature of the BFO-PT films on the dielectric properties is obvious with the film annealed at 600degC presenting better dielectric behavior.