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Experimental Investigation of Pulsed-Laser-Annealed Ultralow-Conduction-Loss 600-V Nonpunchthrough Insulated-Gate Bipolar Transistors

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7 Author(s)
Kwang-Hoon Oh ; Fairchild Korea Semicond., Bucheon ; Seung Chul Lee ; Eun-Taek Kim ; Jong Hun Lee
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