The x-ray induced photoemission measurements made at AFCRL have been used as a basis for comparison to the computed results of the POEM Monte Carlo electron transport code. The results show spectral shapes which closely resemble the experimental data and absolute yield values which agree within 15-27%. The measurements have been continued and the angular distributions from irradiated Al and Ta plates have been determined. The Ta distribution function for electron emission changes from cos Â¿ about the surface normal for normally incident x-rays to isotropic for large angles of incidence. The Al in contrast changes from cos Â¿ for normal incidence to a forward lobed shape for large angles of incidence. Both target materials show substantial yield increases at increasing angles of incidence.