On Wednesday, July 29th, IEEE Xplore will undergo scheduled maintenance from 7:00-9:00 AM ET (11:00-13:00 UTC). During this time there may be intermittent impact on performance. We apologize for any inconvenience.
Performing accurate average current drain measurements of digital programmable components (e.g., microcontrollers, digital signal processors, System-on-Chip, or wireless modules) is a critical and error-prone measurement problem for embedded system manufacturers due to the impulsive time-varying behavior of the current waveforms drawn from a battery in real operating conditions. In this paper, the uncertainty contributions affecting the average current measurements when using a simple and inexpensive digital multimeter are analyzed in depth. Also, a criterion to keep the standard measurement uncertainty below a given threshold is provided. The theoretical analysis is validated by means of meaningful experimental results