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Integral measurement system design using HP's Advanced Design System

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2 Author(s)
P. Valk ; Microwave Component Group, Delft Institute of Microelectronics and Submicron Technology (DIMES), Laboratory ECTM, Delft University of Technology, Feldmannweg 17,2628 CT Delft, The Netherlands Phone: +31-15-2784940, Fax: +31-15-2622163, E-mail: ; J. L. Tauritz