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The Effect of Spacer Thicknesses on Si-Based Resonant Interband Tunneling Diode Performance and Their Application to Low-Power Tunneling Diode SRAM Circuits

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6 Author(s)
Niu Jin ; Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH ; Chung, Sung-Yong ; Yu, Ronghua ; Heyns, R.M.
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