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Wide-area dynamic model validation using FNET measurements

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3 Author(s)
Lang Chen ; Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA ; Markham, P.N. ; Yilu Liu

Author(s)

Lang Chen
Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA
Markham, P.N. ; Yilu Liu