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Statistical estimation and testing for variation root-cause identification of multistage manufacturing Processes

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3 Author(s)
Shiyu Zhou ; Dept. of Ind. Eng., Univ. of Wisconsin-Madison, Madison, WI, USA ; Yong Chen ; Jianjun Shi

Author(s)

Shiyu Zhou
Dept. of Ind. Eng., Univ. of Wisconsin-Madison, Madison, WI, USA
Yong Chen ; Jianjun Shi