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Conflict driven techniques for improving deterministic test pattern generation

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5 Author(s)
Chen Wang ; Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA ; Reddy, S.M. ; Pomeranz, I. ; Xijiang Lin
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Author(s)

Chen Wang
Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
Reddy, S.M. ; Pomeranz, I. ; Xijiang Lin ; Rajski, J.