By Topic

Single-Event Performance and Layout Optimization of Flip-Flops in a 28-nm Bulk Technology

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
9 Author(s)
K. Lilja ; Robust Chip Inc., Pleasanton, CA, USA ; M. Bounasser ; S. -J. Wen ; R. Wong
more authors