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Machine Vision-Based Defect Detection in IC Images Using the Partial Information Correlation Coefficient

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4 Author(s)
Chien-Chih Wang ; Ming Chi University of Technology, Taiwan ; Bernard C. Jiang ; Jing-You Lin ; Chien-Cheng Chu

Author(s)

Chien-Chih Wang
Ming Chi University of Technology, Taiwan
Bernard C. Jiang ; Jing-You Lin ; Chien-Cheng Chu