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A Lipschitz Regularity-Based Statistical Model With Applications in Coordinate Metrology

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4 Author(s)
Heeyoung Kim ; AT&T Labs., Florham Park, NJ, USA ; Xiaoming Huo ; Shilling, M. ; Tran, H.D.

Author(s)

Heeyoung Kim
AT&T Labs., Florham Park, NJ, USA
Xiaoming Huo ; Shilling, M. ; Tran, H.D.