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Sub-30nm scaling and high-speed operation of fully-confined Access-Devices for 3D crosspoint memory based on mixed-ionic-electronic-conduction (MIEC) materials

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18 Author(s)
Virwani, K. ; IBM Almaden Res. Center, San Jose, CA, USA ; Burr, G.W. ; Shenoy, R.S. ; Rettner, C.T.
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