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On-Chip Combined C-V/I-V Characterization System in 45-nm CMOS Technology

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2 Author(s)
Simeon Realov ; Department of Electrical Engineering, Columbia University, New York, NY, USA ; Kenneth L. Shepard

Author(s)

Simeon Realov
Department of Electrical Engineering, Columbia University, New York, NY, USA
Kenneth L. Shepard