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In Situ Measurement and Stress Evaluation for Wire Bonding Using Embedded Piezoresistive Stress Sensors

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6 Author(s)
Woon Yik Yong ; Institute of Microelectronics, Agency for Science, Technology and Research, Singapore ; Xiaowu Zhang ; Tai Chong Chai ; Alastair Trigg
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Author(s)

Woon Yik Yong
Institute of Microelectronics, Agency for Science, Technology and Research, Singapore
Xiaowu Zhang ; Tai Chong Chai ; Alastair Trigg ; Norhanani Binte Jaafar ; Guo-Qiang Lo