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Effects of Neutron-Induced Well Potential Perturbation for Multiple Cell Upset of Flip-Flops in 65 nm

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4 Author(s)
Furuta, J. ; Grad. Sch. of Inf., Kyoto Univ., Uji, Japan ; Yamamoto, R. ; Kobayashi, K. ; Onodera, H.

Author(s)

Furuta, J.
Grad. Sch. of Inf., Kyoto Univ., Uji, Japan
Yamamoto, R. ; Kobayashi, K. ; Onodera, H.