Cart (Loading....) | Create Account
Close category search window
 

A novel no-reference image quality assessment metric based on statistical independence

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
4 Author(s)
Ying Chu ; Sch. of Electron. & Inf. Eng., Xi'an Jiaotong Univ., Xi'an, China ; Xuanqin Mou ; Wei Hong ; Zhen Ji

Author(s)

Ying Chu
Sch. of Electron. & Inf. Eng., Xi'an Jiaotong Univ., Xi'an, China
Xuanqin Mou ; Wei Hong ; Zhen Ji

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.