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Interface quality of Sc2O3 and Gd2O3 films based metal–insulator–silicon structures using Al, Pt, and Ti gates: Effect of buffer layers and scavenging electrodes

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8 Author(s)
Gomez, Alfonso ; Departamento de Electricidad y Electrónica, E.T.S.I. Telecomunicación, University of Valladolid, 47011 Valladolid, Spain ; Castan, Helena ; Garcia, Hector ; Duenas, Salvador
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Author(s)

Gomez, Alfonso
Departamento de Electricidad y Electrónica, E.T.S.I. Telecomunicación, University of Valladolid, 47011 Valladolid, Spain
Castan, Helena ; Garcia, Hector ; Duenas, Salvador ; Bailon, Luis ; Pampillon, Maria Angela ; Feijoo, Pedro Carlos ; San Andres, Enrique