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Soft-Error Rate Induced by Thermal and Low Energy Neutrons in 40 nm SRAMs

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6 Author(s)
J. L. Autran ; Institute of Materials, Microelectronics and Nanosciences of Provence (IM2NP, UMR CNRS 7334), Aix-Marseille University and CNRS, Marseille Cedex 13, France ; S. Serre ; S. Semikh ; D. Munteanu
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Author(s)

J. L. Autran
Institute of Materials, Microelectronics and Nanosciences of Provence (IM2NP, UMR CNRS 7334), Aix-Marseille University and CNRS, Marseille Cedex 13, France
S. Serre ; S. Semikh ; D. Munteanu ; G. Gasiot ; P. Roche