A 1.3-megapixel CMOS image sensor (CIS) with digital correlated double sampling and 17-b column-parallel two-stage folding-integration/cyclic analog-to-digital converters (ADCs) is developed. The image sensor has 0.021-erms- vertical fixed pattern noise, 1.2-erms- pixel temporal noise, and 85.0-dB dynamic range using 32 samplings in the folding-integration ADC mode. Despite the large number of samplings (32 times), the prototype image sensor is demonstrated at the video rate operation of 30 Hz by the new architecture of the proposed ADCs and the high-performance peripheral logic (or digital) parts using low-voltage differential signaling circuit. The developed 17-b CIS has no visible quantization noise at very low light level of 0.01 lx because of high grayscale resolution where 1LSB = 0.1-. The implemented CIS using 0.18- μm technology has the sensitivity of 20 V/lx ·s and the pixel conversion gain of 82 μV/e-.